Background

Atomic Force Microscopy (AFM) is a three-dimensional high resolution imaging technique routinely used in a variety of research fields including physics, biology, chemistry and engineering. It utilises a small probe to obtain information about the sample's surface at up to atomic resolution, such as simple topography, electrical, magnetic and mechanical properties. Furthermore AFM has been increasingly used to probe living tissues or cells at nanometre resolution to determine mechanical properties such as their intrinsic elastic modulus and receptor-ligand interactions.

Advantages of AFM

Actual 3D image of the surface is generated at high resolution
Samples do not require any special treatment such as metal/carbon coating that would irreversibly damage the surface
Most AFM modes equally work well in ambient air or liquid environments making it possible to image living organisms
Quantitative measurements of physical properties

AFM at the LCN

The LCN currently has one of the largest AFM facilities in the UK and is home to twelve AFM instruments which can be used by academic and industrial partners on a contract or collaboration basis. Given the large range of AFM's available, the LCN can accommodate the majority of imaging requirements.

Staff members	Email	Room	Tel
Richard Thorogate	r.thorogate@ucl.ac.uk	2C6	02076790569
Bart Hoogenboom	b.hoogenboom@ucl.ac.uk	4C1	02076790606
Guillaume Charras	g.charras@ucl.ac.uk	4C1	02076792923

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